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Products Fluorescence
Spectrophotometers F-7100 |
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Fluorescence Spectrophotometer
F-7100
Research grade, high sensitivity fluorescence spectrophotometer.
The Hitachi F7100 features the highest sensitivity in
its class and an extremely long lifetime light source
as well as high speed scanning and a host of accessories.
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ITEM
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DESCRIPTION
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Sensitivity (Raman light of water) |
Noise: Background S/N 20,000 or above*6
Noise: Peak 1,200 or above*7
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Minimum sample
volume |
0.6 mL (in
use of standard 10 mm rectangular cell)*8
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Photometric
principle |
Monochromatic
light monitoring ratio calculation |
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Light source |
150 W xenon
lamp, self-deozonating lamp house |
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Monochromator |
Stigmatic
concave diffraction grating: 900 lines/mm, F2.2
Brazed wavelength: Excitation side 300 nm, emission side
400 nm |
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Measuring
wavelength range
(on both EX and EM) |
200 to 750
nm, and zero-order light
(Expandable up to 900 nm with optional detector) |
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Bandpass |
Excitation
side: 1, 2.5, 5, 10, 20 nm
Emission side: 1, 2.5, 5, 10, 20 nm |
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Resolution |
1.0 nm (at
546.1 nm) |
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Wavelength
accuracy |
±1
nm |
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Wavelength
scan speed |
30, 60, 240,
1,200, 2,400, 12,000, 30,000, 60,000 nm/min |
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Wavelength
drive speed |
60,000 nm/min |
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3D measurement
time |
3 min*9
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Response |
Response from
0 to 98 %:?0.002, 0.004, 0.01, 0.05, 0.1, 0.5, 2, 4 s |
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Photometric
value range |
-9999 to 9999 |
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Dimensions/weight |
Spectrophotometer:
620 (W) x 520 (D) x 300 (H) mm (excluding protrusions)/41
kg |
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Working temperature
/ humidity |
15 to 35°C,45
to 80% (condensation not allowed, 70% or less at 30°C
or higher) |
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Power consumption
(spectrophotometer) |
100, 115,
220, 230, 240 V AC, 50/60 Hz, 380 VA |
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FL
Solutions program |
Standard
software |
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Data processing
unit |
PC: Windows® |
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Printer |
Printer compatible
with Windows® |
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*6
EX 350 nm, Slit 10 nm, Response 4 s
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EX 350 nm, Slit 5 nm, Response
2 s
*8
Does not require cell spacer;
no slit restriction
*9
EX 200 to 750 nm, Sampling
interval 10 nm, EM 200 to 750 nm, Sampling interval 10
nm
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FUNCTIONS
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- 3-dimensional measurement
- Wavelength scan
- 3-dimensional scan measurement
- Time scan measurement mode
- Photometry mode
- Others
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